Magnetic Force and Scanning Tunneling Microscopy

This 5-page document, created by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, features an activity that introduces Magnetic Force Microscopy (MFM) and the Scanning Tunneling Microscope (STM). The activity provides extensive background to MFM and STM, including tables and a discussion of Van der Waals force. In the activity, students read the information in the document and answer ten questions related to MFM and STM. Included are questions such as "Why must you use a non-magnetic sample holder for MFM?" and " What is the difference between the two STM modes constant-height and constant-current?"