This webinar, published by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, is the first of a two-part lecture on X-ray diffraction (XRD) for characterization. During this part of the lecture, Dr. Peter Kazarinoff from Portland Community College, introduces and provides background information around XRD and the X-Ray Diffractometer. Covered in the video is a review of fabrication and characterization, wave-based characterization, and the components of a X-Ray Diffractometer. Also included is a video demonstrating sample preparation for an X-Ray Diffractometer.

The webinar runs 19:29 minutes in length. Presentation slides and an audio version of the webinar are also included.

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