Characterization: Atomic Force Microscopy

This webinar, published by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, covers atomic force microscopy and the atomic force microscope (AFM). During the webinar, Dr. Wesley Sanders from Salt Lake Community College provides a general overview of the atomic force microscope, discussing its operation and its components, including the scanner, probe, cantilever, and more. Sanders also covers modes of operation, such as contact mode and tapping mode, and various applications for AFM. Additionally, Johnson Glen, microscopy lab coordinator at Salt Lake Community College, demonstrates the use of an atomic force microscope.

The webinar runs 1:14:03 minutes in length. Presentation slides and an audio version of the webinar are also available.