Advanced Scanning Probe Microscopy (Part 2 of 2)

This video, published by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, is part two of a two-part lecture on advanced scanning probe microscopy for characterization and testing of nanostructures. During this part of the lecture, Sebastien Maeder from Pennsylvania State University continues the discussion of atomic force microscopy (AFM), covering common modes of operation (contact mode and tapping mode) and common pitfalls with AFM, including common image artifacts. Additionally, Maeder walks viewers through the operation of AFM using example photographs.

The video runs 33:01 minutes in length. Also included are presentation slides and an audio version of the video.