Advanced Scanning Probe Microscopy (Part 1 of 2)

This video, published by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, is part one of a two-part lecture on advanced scanning probe microscopy for characterization and testing of nanostructures. During the video, Sebastien Maeder from Pennsylvania State University provides an overview of different scanning probe techniques, discusses scanning tunneling microscopy, and begins a discussion of atomic force microscopy (AFM). Covered is AFM hardware, components, principles of operation, and tip/sample interactions.

The video runs 46:19 minutes in length. Also included are presentation slides and an audio version of the video.