Basic Characterization Techniques

This video, published by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, provides an overview of different basic nanomaterial characterization techniques. During the video, Sebastian Maeder from Pennsylvania State University provides an introduction to metrology and characterization followed by discussion of the following characterization tools: optical microscopes, profilometry, ellipsometry, reflective spectroscopy, and contact angle measurements

The video runs 23:50 minutes in length. Also included are presentation slides and an audio version of the video.