Process Control: Intermittent Contact Mode and Non-Contact Mode Atomic Force Microscopy
This 3-page document, created by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, introduces students to the intermittent contact and non-contact modes of atomic force microscopy and their uses. Students will "understand and learn how to use the Veeco Digital Instruments CP-II and Innova SPM hardware and software" in both these modes. Resonance frequency and sample topography are discussed, and post-lab questions are included to test student comprehension.
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Process Control: Intermittent Mode & Non-Contact Mode AFM
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June 24th, 2010
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