Fundamentals of Metrology and Characterization for Nanotechnology

This webinar, provided by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, provides an overview of the fundamentals of metrology and characterization for nanotechnology. During the webinar, Dr. Diane Hickey-Davis from Pennsylvania State University discusses five types of metrology equipment, including their operations, uses in industry, and how instructors can use them in classroom education. Covered are topics such as particle analysis, quantam tunneling, and particle scanning.

The webinar runs 1:20:23 minutes in length. Also included are the presentation slides and an audio recording of the webinar.