E SC 216: Basic Characterization Techniques Course

Collection description:
This collection, from the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University), includes materials from the undergraduate laboratory course titled Materials in Nanotechnology. The course provides an overview of the characterization and of the testing techniques used for materials and structures which involve the nano-scale." The following six units are included in the course:

1. Characterization Overview
2. Basic Characterization Techniques
3. Microscopy
4. Probe Methods
5. X-Ray Methods
6. Fundamental Review

Course Contents:
Each unit includes a number of lectures and associated laboratory activities that can be viewed separately or downloaded in .ppt and .pdf formats. Lectures provide in-depth coverage of each topic, including illustrations, examples, and comprehensive information. Each lab includes a variety of information, such as an objective, background information, a detailed procedure, charts and tables, and follow-up questions. Course lectures are available to view separately. The following labs are included:

• Ellipsometry
• Basic Characterization Techniques: Introduction to Profilometry
• Process Control: Intermittent Contact Mode and Non-Contact Mode Atomic Force Microscopy
• Magnetic Force & Scanning Tunneling Microscopy
• Transmission Electron Microscopy (TEM) Demonstration
• Introduction to Field Emission Scanning Electron Microscopy (FESEM)
• Scanning Electron Microscopy (FESEM) & Atomic Force Microscope (AFM) Practice Lab
• Process Control: SPM Image Analysis/Processing Software

For orientation purposes E SC 216 Unit 1 Lecture 1 is included as a separate attachment and offers a sample of the type of material included in this course.

Below is a list of the files included in the .zip attachment. The size of each file is included in parenthesis.

E SC 216 - Characterization, Testing of Nanotechnology Structures, and Materials.zip (17 files, 48.3 MB)

• Unit 1 - Basic Techniques (3 files, 5.9 MB)
• Unit 2 - Common Spectroscopic Measurements (3 files, 4.24 MB)
• Unit 3 - Electron Microscopy (3 files, 7.61 MB)
• Unit 4 - Advanced Scanning Probe Microscopy (6 files, 27.2 MB)
• Unit 5 - Surface Analysis (2 files, 4.11 MB)

E SC 216 Associated Laboratory Availabilty.zip (8 files, 3.02 MB)

• Ellipsometry (216 Ellipsometer.pdf 310 KB)
• Basic Characterization Techniques: Introduction to Profilometry (216 Introduction_to_Profilometry.pdf 688 KB)
• Process Control: Intermittent Contact Mode and Non-Contact Mode Atomic Force Microscopy (216_Lab_1 IC NC-AFM 06 24.doc 208 KB)
• Magnetic Force & Scanning Tunneling Microscopy (216_Lab_2 MFM STM 06 24 10.doc 161 KB)
• Transmission Electron Microscopy (TEM) Demonstration (216_Lab_3 TEM Demo 06 24 10.doc 143 KB)
• Introduction to Field Emission Scanning Electron Microscopy (FESEM) (216_Lab_4 Intro to FESEM 06 24 10.doc 570 KB)
• Scanning Electron Microscopy (FESEM) & Atomic Force Microscope (AFM) Practice Lab (216_Lab_5%2C6 SEM - AFM Practice Lab 06 24 10.doc 582 KB)
• Process Control: SPM Image Analysis/Processing Software (216_Lab_7 SPMLab Image Analysis 06 24 10.doc 431 KB)