Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nanoscale

This video, published by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, covers the focused ion beam (FIB) and its use for preparing materials for sample analysis. In the video, Wook Jun Nam from Pennsylvania State University defines and provides an overview of FIB, walks through the operation of FIB, and discusses the various applications of FIB. Covered are concepts such as the eucentric point, FIB grain contrast, and transmission electron microscopy (TEM) sample preparation.

The video runs 49:07 minutes in length. Also included are presentation slides and an audio version of the video.