X-Ray Photoelectron Spectroscopy (XPS)

This audio recording, provided by the Nanotechnology Applications and Career Knowledge Support (NACK) Center at Pennsylvania State University, covers X-ray photoelectron spectroscopy for characterization at the nanoscale. During the recording, Simchi Hamed from Pennsylvania State University introduces XPS, walking through its history and the principles of XPS Analysis. Next, Simchi discusses the instruments required for XPS calculation, peak characteristics in XPS analysis, quantitative analysis, and data on depth profiling that can be done in XPS analysis.

The recording runs 29:08 minutes in length. Also included are the presentation slides that correspond with the audio lecture.